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September 2007 [Test & Measurement] Tracking Advances in Pulsed S-Parameter Measurements Scattering (S) parameter measurements with a vector network analyzer (VNA) are usually performed with a continuous-wave (CW) stimulus applied to the device under test (DUT). In some cases, however, it may be necessary to use a pulsed stimulus for the S-parameter measurements. For example, a DUT that is not thermally coupled (such as a power transistor) might be damaged by the heat buildup of CW measurements, but safely characterized by pulsed measurements. By properly... November 2003 [Test & Measurement] Make Accurate Pulsed S-Parameter Measurements Vector network analyzers are traditionally used to measure the continuous-wave (CW) S-parameter performance of components. Often, under these operating conditions, the analyzer is functioning as a narrowband measurement instrument. It transmits a... |
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